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%0 Conference Paper
%1 conf/irps/RuzzarinMSMZSP18
%A Ruzzarin, Maria
%A Meneghini, Matteo
%A Santi, Carlo De
%A Meneghesso, Gaudenzio
%A Zanoni, Enrico
%A Sun, Min
%A Palacios, Tomás
%B IRPS
%D 2018
%I IEEE
%K dblp
%P 4
%T Degradation of vertical GaN FETs under gate and drain stress.
%U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#RuzzarinMSMZSP18
%@ 978-1-5386-5479-8
@inproceedings{conf/irps/RuzzarinMSMZSP18,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Ruzzarin, Maria and Meneghini, Matteo and Santi, Carlo De and Meneghesso, Gaudenzio and Zanoni, Enrico and Sun, Min and Palacios, Tomás},
biburl = {https://www.bibsonomy.org/bibtex/26723d2cac38788fc64db72ceaae08fe3/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2018},
ee = {https://doi.org/10.1109/IRPS.2018.8353579},
interhash = {c98650f53ac1b68392ccf1b5f29b597c},
intrahash = {6723d2cac38788fc64db72ceaae08fe3},
isbn = {978-1-5386-5479-8},
keywords = {dblp},
pages = 4,
publisher = {IEEE},
timestamp = {2024-05-13T09:40:58.000+0200},
title = {Degradation of vertical GaN FETs under gate and drain stress.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#RuzzarinMSMZSP18},
year = 2018
}