%0 Journal Article %1 journals/et/ShangTLFZ20 %A Shang, Yuling %A Tan, Weipeng %A Li, Chunquan %A Fan, Haihua %A Zeng, Lizhen %D 2020 %J J. Electron. Test. %K dblp %N 6 %P 771-783 %T Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC. %U http://dblp.uni-trier.de/db/journals/et/et36.html#ShangTLFZ20 %V 36

@article{journals/et/ShangTLFZ20, added-at = {2021-02-05T00:00:00.000+0100}, author = {Shang, Yuling and Tan, Weipeng and Li, Chunquan and Fan, Haihua and Zeng, Lizhen}, biburl = {https://www.bibsonomy.org/bibtex/210181054f1f081bd13ae28e145e2237e/dblp}, ee = {https://doi.org/10.1007/s10836-020-05916-y}, interhash = {ca056a0927ceee958ec4a585bbf162e3}, intrahash = {10181054f1f081bd13ae28e145e2237e}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 6, pages = {771-783}, timestamp = {2024-04-08T20:52:40.000+0200}, title = {Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D IC.}, url = {http://dblp.uni-trier.de/db/journals/et/et36.html#ShangTLFZ20}, volume = 36, year = 2020 }