%0 Conference Paper %1 conf/irps/WielandOSBKSMRHNGPO23 %A Wieland, D. %A Ofner, S. %A Stabentheiner, M. %A Butej, B. %A Koller, Christian %A Sun, J. %A Minetto, Andrea %A Reiser, K. %A Häberlen, Oliver %A Nelhiebel, Michael %A Glavanovics, Michael %A Pogany, Dionyz %A Ostermaier, Clemens %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#WielandOSBKSMRHNGPO23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/WielandOSBKSMRHNGPO23, added-at = {2023-05-24T00:00:00.000+0200}, author = {Wieland, D. and Ofner, S. and Stabentheiner, M. and Butej, B. and Koller, Christian and Sun, J. and Minetto, Andrea and Reiser, K. and Häberlen, Oliver and Nelhiebel, Michael and Glavanovics, Michael and Pogany, Dionyz and Ostermaier, Clemens}, biburl = {https://www.bibsonomy.org/bibtex/296a65ff5cc17a3c50aac77a600218d02/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117943}, interhash = {caae9ae7851cc983ac1dbc3ba3aa9c36}, intrahash = {96a65ff5cc17a3c50aac77a600218d02}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#WielandOSBKSMRHNGPO23}, year = 2023 }