%0 Conference Paper %1 conf/vsip/ZhouYZC023 %A Zhou, Biao %A Yu, Xiaoyu %A Zhang, Yang %A Chen, Haisong %A Wang, Aili %B VSIP %D 2023 %I ACM %K dblp %P 134-142 %T Chip Surface Defect Detection Algorithm Based on Improved YOLOv3. %U http://dblp.uni-trier.de/db/conf/vsip/vsip2023.html#ZhouYZC023

@inproceedings{conf/vsip/ZhouYZC023, added-at = {2024-05-31T00:00:00.000+0200}, author = {Zhou, Biao and Yu, Xiaoyu and Zhang, Yang and Chen, Haisong and Wang, Aili}, biburl = {https://www.bibsonomy.org/bibtex/22385ffc9d54fed8b94440edcae24ab70/dblp}, booktitle = {VSIP}, crossref = {conf/vsip/2023}, ee = {https://doi.org/10.1145/3638682.3638703}, interhash = {ce009d105390b25d73445c4cbccb0cf8}, intrahash = {2385ffc9d54fed8b94440edcae24ab70}, keywords = {dblp}, pages = {134-142}, publisher = {ACM}, timestamp = {2024-06-03T07:19:05.000+0200}, title = {Chip Surface Defect Detection Algorithm Based on Improved YOLOv3.}, url = {http://dblp.uni-trier.de/db/conf/vsip/vsip2023.html#ZhouYZC023}, year = 2023 }