%0 Conference Paper %1 conf/itc/KwonW95 %A Kwon, Young-Jun %A Walker, D. M. H. %B ITC %D 1995 %I IEEE Computer Society %K dblp %P 626-635 %T Yiel Learning via Functional Test Data. %U http://dblp.uni-trier.de/db/conf/itc/itc1995.html#KwonW95 %@ 0-7803-2992-9

@inproceedings{conf/itc/KwonW95, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kwon, Young-Jun and Walker, D. M. H.}, biburl = {https://www.bibsonomy.org/bibtex/2f4980334dfbd8385ef9925fe95bf635b/dblp}, booktitle = {ITC}, crossref = {conf/itc/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1995.529891}, interhash = {d04fa7352989200ac122fa2a0e2a1d55}, intrahash = {f4980334dfbd8385ef9925fe95bf635b}, isbn = {0-7803-2992-9}, keywords = {dblp}, pages = {626-635}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:30.000+0200}, title = {Yiel Learning via Functional Test Data.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1995.html#KwonW95}, year = 1995 }