%0 Journal Article %1 journals/mr/GuitardTBEBPSNR04 %A Guitard, Nicolas %A Trémouilles, David %A Bafleur, Marise %A Escotte, Laurent %A Bary, Laurent %A Perdu, Philippe %A Sarrabayrouse, Gérard %A Nolhier, Nicolas %A Reyna-Rojas, Roberto %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1781-1786 %T Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#GuitardTBEBPSNR04 %V 44

@article{journals/mr/GuitardTBEBPSNR04, added-at = {2020-02-22T00:00:00.000+0100}, author = {Guitard, Nicolas and Trémouilles, David and Bafleur, Marise and Escotte, Laurent and Bary, Laurent and Perdu, Philippe and Sarrabayrouse, Gérard and Nolhier, Nicolas and Reyna-Rojas, Roberto}, biburl = {https://www.bibsonomy.org/bibtex/27168a5e3a49148fb8e7ff6eafc72df7c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.106}, interhash = {d05bcf231870ac3f31823e6c154946cc}, intrahash = {7168a5e3a49148fb8e7ff6eafc72df7c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1781-1786}, timestamp = {2020-02-25T13:28:32.000+0100}, title = {Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#GuitardTBEBPSNR04}, volume = 44, year = 2004 }