%0 Conference Paper %1 conf/i2mtc/ZhangDZY19 %A Zhang, Zhijie %A Dong, Ningchen %A Zhao, Chenyang %A Yin, Wuliang %B I2MTC %D 2019 %I IEEE %K dblp %P 1-5 %T Metal Surface Defect Detection System Based on Semiconductor Laser and Infrared Thermal Imaging. %U http://dblp.uni-trier.de/db/conf/i2mtc/i2mtc2019.html#ZhangDZY19 %@ 978-1-5386-3460-8

@inproceedings{conf/i2mtc/ZhangDZY19, added-at = {2019-09-18T00:00:00.000+0200}, author = {Zhang, Zhijie and Dong, Ningchen and Zhao, Chenyang and Yin, Wuliang}, biburl = {https://www.bibsonomy.org/bibtex/20e88c7135652ae2aee8370b0895aa495/dblp}, booktitle = {I2MTC}, crossref = {conf/i2mtc/2019}, ee = {https://doi.org/10.1109/I2MTC.2019.8826839}, interhash = {d081bcfca425c05273cc3ce89ec1bda4}, intrahash = {0e88c7135652ae2aee8370b0895aa495}, isbn = {978-1-5386-3460-8}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2019-10-17T15:07:23.000+0200}, title = {Metal Surface Defect Detection System Based on Semiconductor Laser and Infrared Thermal Imaging.}, url = {http://dblp.uni-trier.de/db/conf/i2mtc/i2mtc2019.html#ZhangDZY19}, year = 2019 }