%0 Conference Paper %1 conf/drc/ZhangT0SLWWQW21 %A Zhang, Wenbin %A Tang, Jianshi %A Gao, Bin %A Sun, Wen %A Liu, Wei %A Wang, Kanwen %A Wu, Wei %A Qian, He %A Wu, Huaqiang %B DRC %D 2021 %I IEEE %K dblp %P 1-2 %T Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array. %U http://dblp.uni-trier.de/db/conf/drc/drc2021.html#ZhangT0SLWWQW21 %@ 978-1-6654-1240-7

@inproceedings{conf/drc/ZhangT0SLWWQW21, added-at = {2021-07-06T00:00:00.000+0200}, author = {Zhang, Wenbin and Tang, Jianshi and Gao, Bin and Sun, Wen and Liu, Wei and Wang, Kanwen and Wu, Wei and Qian, He and Wu, Huaqiang}, biburl = {https://www.bibsonomy.org/bibtex/25c5ad69abf3bbaa258d5426a9b2810d9/dblp}, booktitle = {DRC}, crossref = {conf/drc/2021}, ee = {https://doi.org/10.1109/DRC52342.2021.9467220}, interhash = {d175a936256965b76b1a7a44b991b41f}, intrahash = {5c5ad69abf3bbaa258d5426a9b2810d9}, isbn = {978-1-6654-1240-7}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T23:47:33.000+0200}, title = {Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array.}, url = {http://dblp.uni-trier.de/db/conf/drc/drc2021.html#ZhangT0SLWWQW21}, year = 2021 }