%0 Conference Paper %1 conf/irps/MakarovKRCGVHEG19 %A Makarov, Alexander %A Kaczer, Ben %A Roussel, Philippe %A Chasin, Adrian Vaisman %A Grill, Alexander %A Vandemaele, Michiel %A Hellings, Geert %A El-Sayed, Al-Moatasem %A Grasser, Tibor %A Linten, Dimitri %A Tyaginov, Stanislav %B IRPS %D 2019 %I IEEE %K dblp %P 1-7 %T Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#MakarovKRCGVHEG19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/MakarovKRCGVHEG19, added-at = {2023-05-24T00:00:00.000+0200}, author = {Makarov, Alexander and Kaczer, Ben and Roussel, Philippe and Chasin, Adrian Vaisman and Grill, Alexander and Vandemaele, Michiel and Hellings, Geert and El-Sayed, Al-Moatasem and Grasser, Tibor and Linten, Dimitri and Tyaginov, Stanislav}, biburl = {https://www.bibsonomy.org/bibtex/2b63829c497c719c0afb0fc03f16fc680/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720584}, interhash = {d22ac6a3ee452fce53286e80762c56e7}, intrahash = {b63829c497c719c0afb0fc03f16fc680}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-10T16:55:06.000+0200}, title = {Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#MakarovKRCGVHEG19}, year = 2019 }