%0 Conference Paper %1 conf/asicon/ZhengCLCCC23 %A Zheng, Mingyue %A Chen, Wangyong %A Lyu, Yaoyang %A Chen, Haifeng %A Chen, Jiahui %A Cai, Linlin %B ASICON %D 2023 %I IEEE %K dblp %P 1-4 %T Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2023.html#ZhengCLCCC23 %@ 979-8-3503-1298-0

@inproceedings{conf/asicon/ZhengCLCCC23, added-at = {2024-02-16T00:00:00.000+0100}, author = {Zheng, Mingyue and Chen, Wangyong and Lyu, Yaoyang and Chen, Haifeng and Chen, Jiahui and Cai, Linlin}, biburl = {https://www.bibsonomy.org/bibtex/26d61177d43d4eeae8cd74c1acd37d117/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2023}, ee = {https://doi.org/10.1109/ASICON58565.2023.10396237}, interhash = {d22fe2135852cefa6fc875e43e0ebb25}, intrahash = {6d61177d43d4eeae8cd74c1acd37d117}, isbn = {979-8-3503-1298-0}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T23:07:08.000+0200}, title = {Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2023.html#ZhengCLCCC23}, year = 2023 }