%0 Journal Article %1 journals/tim/ChenAS08 %A Chen, Shu %A Afsar, Mohammed N. %A Sakdatorn, D. %D 2008 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 4 %P 706-715 %T Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths. %U http://dblp.uni-trier.de/db/journals/tim/tim57.html#ChenAS08 %V 57

@article{journals/tim/ChenAS08, added-at = {2016-03-09T00:00:00.000+0100}, author = {Chen, Shu and Afsar, Mohammed N. and Sakdatorn, D.}, biburl = {https://www.bibsonomy.org/bibtex/2c4434a85218df1841329e334da4d161a/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2007.913594}, interhash = {d494ae2b9bb6a0d354b49f76984e24d7}, intrahash = {c4434a85218df1841329e334da4d161a}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 4, pages = {706-715}, timestamp = {2016-03-10T18:30:28.000+0100}, title = {Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim57.html#ChenAS08}, volume = 57, year = 2008 }