%0 Conference Paper %1 conf/bibm/Al-HaijaN19 %A Al-Haija, Qasem Abu %A Nasr, Kamal Al %B BIBM %D 2019 %E Yoo, Illhoi %E Bi, Jinbo %E Hu, Xiaohua %I IEEE %K dblp %P 2661-2668 %T Supervised Regression Study for Electron Microscopy Data. %U http://dblp.uni-trier.de/db/conf/bibm/bibm2019.html#Al-HaijaN19 %@ 978-1-7281-1867-3

@inproceedings{conf/bibm/Al-HaijaN19, added-at = {2021-10-14T00:00:00.000+0200}, author = {Al-Haija, Qasem Abu and Nasr, Kamal Al}, biburl = {https://www.bibsonomy.org/bibtex/2976b5c69d2b443d730d4e02cf46d89a9/dblp}, booktitle = {BIBM}, crossref = {conf/bibm/2019}, editor = {Yoo, Illhoi and Bi, Jinbo and Hu, Xiaohua}, ee = {https://doi.org/10.1109/BIBM47256.2019.8983101}, interhash = {d50252b1b4dbb677635f06de64cc2ad7}, intrahash = {976b5c69d2b443d730d4e02cf46d89a9}, isbn = {978-1-7281-1867-3}, keywords = {dblp}, pages = {2661-2668}, publisher = {IEEE}, timestamp = {2024-04-09T21:32:17.000+0200}, title = {Supervised Regression Study for Electron Microscopy Data.}, url = {http://dblp.uni-trier.de/db/conf/bibm/bibm2019.html#Al-HaijaN19}, year = 2019 }