%0 Journal Article %1 journals/mr/NilamaniCR18 %A Nilamani, S. %A Chitra, P. %A Ramakrishnan, V. N. %D 2018 %J Microelectron. Reliab. %K dblp %P 11-19 %T Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance. %U http://dblp.uni-trier.de/db/journals/mr/mr82.html#NilamaniCR18 %V 82

@article{journals/mr/NilamaniCR18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Nilamani, S. and Chitra, P. and Ramakrishnan, V. N.}, biburl = {https://www.bibsonomy.org/bibtex/250c97e39db64c445479ee11416171755/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.01.002}, interhash = {d5acd3c8ed870d73ba6ab07df5023914}, intrahash = {50c97e39db64c445479ee11416171755}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {11-19}, timestamp = {2020-02-25T13:22:20.000+0100}, title = {Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr82.html#NilamaniCR18}, volume = 82, year = 2018 }