%0 Conference Paper %1 conf/icsm/HaoZZMS05 %A Hao, Dan %A Zhang, Lu %A Zhong, Hao %A Mei, Hong %A Sun, Jiasu %B ICSM %D 2005 %I IEEE Computer Society %K dblp %P 683-686 %T Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study. %U http://dblp.uni-trier.de/db/conf/icsm/icsm2005.html#HaoZZMS05 %@ 0-7695-2368-4

@inproceedings{conf/icsm/HaoZZMS05, added-at = {2023-05-09T00:00:00.000+0200}, author = {Hao, Dan and Zhang, Lu and Zhong, Hao and Mei, Hong and Sun, Jiasu}, biburl = {https://www.bibsonomy.org/bibtex/27ff84c98cd72c9bf6fc1f74cf1028320/dblp}, booktitle = {ICSM}, crossref = {conf/icsm/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICSM.2005.43}, interhash = {d771cfaadb58651e2933e28b5b78584d}, intrahash = {7ff84c98cd72c9bf6fc1f74cf1028320}, isbn = {0-7695-2368-4}, keywords = {dblp}, pages = {683-686}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T22:03:54.000+0200}, title = {Eliminating Harmful Redundancy for Testing-Based Fault Localization Using Test Suite Reduction: An Experimental Study.}, url = {http://dblp.uni-trier.de/db/conf/icsm/icsm2005.html#HaoZZMS05}, year = 2005 }