%0 Journal Article %1 journals/mr/MonsieurVRBPG01 %A Monsieur, Frederic %A Vincent, E. %A Roy, David %A Bruyère, S. %A Pananakakis, G. %A Ghibaudo, Gérard %D 2001 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1295-1300 %T Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#MonsieurVRBPG01 %V 41

@article{journals/mr/MonsieurVRBPG01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Monsieur, Frederic and Vincent, E. and Roy, David and Bruyère, S. and Pananakakis, G. and Ghibaudo, Gérard}, biburl = {https://www.bibsonomy.org/bibtex/2997b8db7fcacfe7b3b6414e6318c278f/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00183-4}, interhash = {d79800abf809830d9fed8f157f596aa9}, intrahash = {997b8db7fcacfe7b3b6414e6318c278f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1295-1300}, timestamp = {2020-02-25T13:22:34.000+0100}, title = {Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#MonsieurVRBPG01}, volume = 41, year = 2001 }