%0 Conference Paper %1 conf/vlsit/YooJLCBLJKKLKJP23 %A Yoo, J.-H. %A Jo, H.-B. %A Lee, I.-G. %A Choi, S.-M. %A Baek, J.-M. %A Lee, S. T. %A Jang, H. %A Kong, M. W. %A Kim, H. H. %A Lee, H. J. %A Kim, H.-J. %A Jeong, H.-S. %A Park, W.-S. %A Ko, D.-H. %A Shin, S. H. %A Kwon, H.-M. %A Kim, S. K. %A Kim, J. G. %A Yun, J. %A Kim, T. %A Shin, K.-Y. %A Kim, T.-W. %A Shin, J.-K. %A Lee, J.-H. %A Shin, C.-S. %A Seo, K.-S. %A Kim, Dae-Hyun %B VLSI Technology and Circuits %D 2023 %I IEEE %K dblp %P 1-2 %T Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling. %U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#YooJLCBLJKKLKJP23 %@ 978-4-86348-806-9

@inproceedings{conf/vlsit/YooJLCBLJKKLKJP23, added-at = {2023-12-05T00:00:00.000+0100}, author = {Yoo, J.-H. and Jo, H.-B. and Lee, I.-G. and Choi, S.-M. and Baek, J.-M. and Lee, S. T. and Jang, H. and Kong, M. W. and Kim, H. H. and Lee, H. J. and Kim, H.-J. and Jeong, H.-S. and Park, W.-S. and Ko, D.-H. and Shin, S. H. and Kwon, H.-M. and Kim, S. K. and Kim, J. G. and Yun, J. and Kim, T. and Shin, K.-Y. and Kim, T.-W. and Shin, J.-K. and Lee, J.-H. and Shin, C.-S. and Seo, K.-S. and Kim, Dae-Hyun}, biburl = {https://www.bibsonomy.org/bibtex/234f84d31d7e57da3d531cac709102a75/dblp}, booktitle = {VLSI Technology and Circuits}, crossref = {conf/vlsit/2023}, ee = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185250}, interhash = {db80c11efd21791538e08aaaa06589c3}, intrahash = {34f84d31d7e57da3d531cac709102a75}, isbn = {978-4-86348-806-9}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T19:13:01.000+0200}, title = {Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling.}, url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#YooJLCBLJKKLKJP23}, year = 2023 }