%0 Journal Article %1 journals/tim/OudebrouckxVNBW21 %A Oudebrouckx, Gilles %A Vandenryt, Thijs %A Nivelle, Philippe %A Bormans, Seppe %A Wagner, Patrick H. %A Thoelen, Ronald %D 2021 %J IEEE Trans. Instrum. Meas. %K dblp %P 1-10 %T Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications. %U http://dblp.uni-trier.de/db/journals/tim/tim70.html#OudebrouckxVNBW21 %V 70

@article{journals/tim/OudebrouckxVNBW21, added-at = {2023-02-24T00:00:00.000+0100}, author = {Oudebrouckx, Gilles and Vandenryt, Thijs and Nivelle, Philippe and Bormans, Seppe and Wagner, Patrick H. and Thoelen, Ronald}, biburl = {https://www.bibsonomy.org/bibtex/2d6832387b45b163bdc551d3293906b58/dblp}, ee = {https://doi.org/10.1109/TIM.2020.3033444}, interhash = {dbbadc1c513f875c87513c2b478e5d72}, intrahash = {d6832387b45b163bdc551d3293906b58}, journal = {IEEE Trans. Instrum. Meas.}, keywords = {dblp}, pages = {1-10}, timestamp = {2024-04-08T14:37:30.000+0200}, title = {Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim70.html#OudebrouckxVNBW21}, volume = 70, year = 2021 }