%0 Journal Article %1 journals/et/LuoWLJ12 %A Luo, Hui %A Wang, Youren %A Lin, Hua %A Jiang, Yuanyuan %D 2012 %J J. Electron. Test. %K dblp %N 3 %P 279-290 %T A New Optimal Test Node Selection Method for Analog Circuit. %U http://dblp.uni-trier.de/db/journals/et/et28.html#LuoWLJ12 %V 28

@article{journals/et/LuoWLJ12, added-at = {2020-09-11T00:00:00.000+0200}, author = {Luo, Hui and Wang, Youren and Lin, Hua and Jiang, Yuanyuan}, biburl = {https://www.bibsonomy.org/bibtex/2c23a6ccd340b1debab469d3dfa1a96ef/dblp}, ee = {https://doi.org/10.1007/s10836-011-5274-z}, interhash = {dc5070d8f2bb450cf41a01ecd80ff2c9}, intrahash = {c23a6ccd340b1debab469d3dfa1a96ef}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {279-290}, timestamp = {2020-09-12T11:40:53.000+0200}, title = {A New Optimal Test Node Selection Method for Analog Circuit.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#LuoWLJ12}, volume = 28, year = 2012 }