%0 Conference Paper %1 conf/icecsys/LinM02 %A Lin, San %A Mourad, Samiha %B ICECS %D 2002 %I IEEE %K dblp %P 467-470 %T Embedded testing for data communications circuits. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2002.html#LinM02 %@ 0-7803-7596-3

@inproceedings{conf/icecsys/LinM02, added-at = {2021-01-15T00:00:00.000+0100}, author = {Lin, San and Mourad, Samiha}, biburl = {https://www.bibsonomy.org/bibtex/29aa582a80bdd355b1efd492e87ec0aa8/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2002}, ee = {https://doi.org/10.1109/ICECS.2002.1046198}, interhash = {de2f7ce68120a5afb9c0e79d2cbd2744}, intrahash = {9aa582a80bdd355b1efd492e87ec0aa8}, isbn = {0-7803-7596-3}, keywords = {dblp}, pages = {467-470}, publisher = {IEEE}, timestamp = {2024-04-09T16:20:38.000+0200}, title = {Embedded testing for data communications circuits.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2002.html#LinM02}, year = 2002 }