%0 Journal Article %1 journals/mr/LiuYL08 %A Liu, Xiang %A Yuan, Jiann-Shiun %A Liou, Juin J. %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1212-1215 %T InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#LiuYL08 %V 48

@article{journals/mr/LiuYL08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liu, Xiang and Yuan, Jiann-Shiun and Liou, Juin J.}, biburl = {https://www.bibsonomy.org/bibtex/21c36fc33e66a9cfafce9f36126b43646/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.06.009}, interhash = {e0f3cfbc67229f2b098c9ce327f6026a}, intrahash = {1c36fc33e66a9cfafce9f36126b43646}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1212-1215}, timestamp = {2020-02-25T13:26:32.000+0100}, title = {InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#LiuYL08}, volume = 48, year = 2008 }