%0 Journal Article %1 journals/jssc/KapustaZL14 %A Kapusta, Ron %A Zhu, Haiyang %A Lyden, Colin %D 2014 %J IEEE J. Solid State Circuits %K dblp %N 8 %P 1694-1701 %T Sampling Circuits That Break the kT/C Thermal Noise Limit. %U http://dblp.uni-trier.de/db/journals/jssc/jssc49.html#KapustaZL14 %V 49

@article{journals/jssc/KapustaZL14, added-at = {2022-01-03T00:00:00.000+0100}, author = {Kapusta, Ron and Zhu, Haiyang and Lyden, Colin}, biburl = {https://www.bibsonomy.org/bibtex/2e5caa32e2c1ee5586ff5023485f386e7/dblp}, ee = {https://doi.org/10.1109/JSSC.2014.2320465}, interhash = {e14c560d3ef76bb8e9dff99c1b8a8d25}, intrahash = {e5caa32e2c1ee5586ff5023485f386e7}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 8, pages = {1694-1701}, timestamp = {2024-04-08T10:44:16.000+0200}, title = {Sampling Circuits That Break the kT/C Thermal Noise Limit.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc49.html#KapustaZL14}, volume = 49, year = 2014 }