Inproceedings,
Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited).
S. Reggiani, E. Gnani, A. Gnudi, G. Baccarani, S. Poli, R. Wise, M. Chuang, W. Tian, and M. Denison.ESSDERC, page 91-94. IEEE, (2013)
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- conf/essderc/ReggianiGGBPWCTD13
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- inproceedings
- booktitle
- ESSDERC
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- 2013
- pages
- 91-94
- publisher
- IEEE
- crossref
- conf/essderc/2013
- ee
- https://www.wikidata.org/entity/Q60583994
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- http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ReggianiGGBPWCTD13
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%1 conf/essderc/ReggianiGGBPWCTD13
%A Reggiani, Susanna
%A Gnani, Elena
%A Gnudi, Antonio
%A Baccarani, Giorgio
%A Poli, Stefano
%A Wise, Rick
%A Chuang, Ming-Yeh
%A Tian, Weidong
%A Denison, Marie
%B ESSDERC
%D 2013
%I IEEE
%K dblp
%P 91-94
%T Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited).
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ReggianiGGBPWCTD13
@inproceedings{conf/essderc/ReggianiGGBPWCTD13,
added-at = {2021-05-05T00:00:00.000+0200},
author = {Reggiani, Susanna and Gnani, Elena and Gnudi, Antonio and Baccarani, Giorgio and Poli, Stefano and Wise, Rick and Chuang, Ming-Yeh and Tian, Weidong and Denison, Marie},
biburl = {https://www.bibsonomy.org/bibtex/2684944d14e44b453c2353b1964e056f7/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2013},
ee = {https://www.wikidata.org/entity/Q60583994},
interhash = {e48457f3e33091ae6b6755aee79d3106},
intrahash = {684944d14e44b453c2353b1964e056f7},
keywords = {dblp},
pages = {91-94},
publisher = {IEEE},
timestamp = {2024-04-10T10:01:37.000+0200},
title = {Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited).},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ReggianiGGBPWCTD13},
year = 2013
}