%0 Journal Article %1 journals/et/KumarAL16 %A Kumar, T. Nandha %A Almurib, Haider A. F. %A Lombardi, Fabrizio %D 2016 %J J. Electron. Test. %K dblp %N 5 %P 587-599 %T Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT. %U http://dblp.uni-trier.de/db/journals/et/et32.html#KumarAL16 %V 32

@article{journals/et/KumarAL16, added-at = {2020-09-11T00:00:00.000+0200}, author = {Kumar, T. Nandha and Almurib, Haider A. F. and Lombardi, Fabrizio}, biburl = {https://www.bibsonomy.org/bibtex/239888e7223475f8653dcc65ae29cf6e6/dblp}, ee = {https://doi.org/10.1007/s10836-016-5611-3}, interhash = {e56a0b9fa788e3a205ef65752d4cbc3d}, intrahash = {39888e7223475f8653dcc65ae29cf6e6}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {587-599}, timestamp = {2020-09-12T11:41:17.000+0200}, title = {Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT.}, url = {http://dblp.uni-trier.de/db/journals/et/et32.html#KumarAL16}, volume = 32, year = 2016 }