%0 Journal Article %1 journals/mr/YuJY06 %A Yu, Chuanzhao %A Jiang, L. %A Yuan, Jiann-Shiun %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1840-1843 %T Study of performance degradations in DC-DC converter due to hot carrier stress by simulation. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#YuJY06 %V 46

@article{journals/mr/YuJY06, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yu, Chuanzhao and Jiang, L. and Yuan, Jiann-Shiun}, biburl = {https://www.bibsonomy.org/bibtex/274b156dcf7d02ca5fa6a779199d3d1ec/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.079}, interhash = {e9a0ed43859e79b3c5c62639048e598e}, intrahash = {74b156dcf7d02ca5fa6a779199d3d1ec}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1840-1843}, timestamp = {2020-02-25T13:24:01.000+0100}, title = {Study of performance degradations in DC-DC converter due to hot carrier stress by simulation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#YuJY06}, volume = 46, year = 2006 }