%0 Journal Article %1 journals/tsmc/DasJ92 %A Das, Sunil R. %A Jone, Wen-Ben %D 1992 %J IEEE Trans. Syst. Man Cybern. %K dblp %N 4 %P 748-754 %T On random testing for combinational circuits with a high measure of confidence. %U http://dblp.uni-trier.de/db/journals/tsmc/tsmc22.html#DasJ92 %V 22

@article{journals/tsmc/DasJ92, added-at = {2020-05-20T00:00:00.000+0200}, author = {Das, Sunil R. and Jone, Wen-Ben}, biburl = {https://www.bibsonomy.org/bibtex/25be393c2a04ab383929cfce6251260b8/dblp}, ee = {https://doi.org/10.1109/21.156587}, interhash = {ea9430009c1d685793373849de61de97}, intrahash = {5be393c2a04ab383929cfce6251260b8}, journal = {IEEE Trans. Syst. Man Cybern.}, keywords = {dblp}, number = 4, pages = {748-754}, timestamp = {2020-05-21T11:40:27.000+0200}, title = {On random testing for combinational circuits with a high measure of confidence.}, url = {http://dblp.uni-trier.de/db/journals/tsmc/tsmc22.html#DasJ92}, volume = 22, year = 1992 }