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%0 Journal Article
%1 journals/tsmc/DasJ92
%A Das, Sunil R.
%A Jone, Wen-Ben
%D 1992
%J IEEE Trans. Syst. Man Cybern.
%K dblp
%N 4
%P 748-754
%T On random testing for combinational circuits with a high measure of confidence.
%U http://dblp.uni-trier.de/db/journals/tsmc/tsmc22.html#DasJ92
%V 22
@article{journals/tsmc/DasJ92,
added-at = {2020-05-20T00:00:00.000+0200},
author = {Das, Sunil R. and Jone, Wen-Ben},
biburl = {https://www.bibsonomy.org/bibtex/25be393c2a04ab383929cfce6251260b8/dblp},
ee = {https://doi.org/10.1109/21.156587},
interhash = {ea9430009c1d685793373849de61de97},
intrahash = {5be393c2a04ab383929cfce6251260b8},
journal = {IEEE Trans. Syst. Man Cybern.},
keywords = {dblp},
number = 4,
pages = {748-754},
timestamp = {2020-05-21T11:40:27.000+0200},
title = {On random testing for combinational circuits with a high measure of confidence.},
url = {http://dblp.uni-trier.de/db/journals/tsmc/tsmc22.html#DasJ92},
volume = 22,
year = 1992
}