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%0 Conference Paper
%1 conf/itc/WatsonNMB82
%A Watson, I. M.
%A Newkirk, John A.
%A Mathews, Robert G.
%A Boyle, D. B.
%B ITC
%D 1982
%I IEEE Computer Society
%K dblp
%P 499-502
%T ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs.
%U http://dblp.uni-trier.de/db/conf/itc/itc1982.html#WatsonNMB82
@inproceedings{conf/itc/WatsonNMB82,
added-at = {2006-06-27T00:00:00.000+0200},
author = {Watson, I. M. and Newkirk, John A. and Mathews, Robert G. and Boyle, D. B.},
biburl = {https://www.bibsonomy.org/bibtex/2a752360360b42fba9d307f732c309507/dblp},
booktitle = {ITC},
crossref = {conf/itc/1982},
date = {2006-06-27},
description = {dblp},
interhash = {ebf1cec17f57472de3f6cb30ea21282b},
intrahash = {a752360360b42fba9d307f732c309507},
keywords = {dblp},
pages = {499-502},
publisher = {IEEE Computer Society},
timestamp = {2006-06-27T00:00:00.000+0200},
title = {ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1982.html#WatsonNMB82},
year = 1982
}
