%0 Journal Article %1 journals/asc/LinWHK11 %A Lin, Kuo-Ping %A Wu, Ming-Jia %A Hung, Kuo-Chen %A Kuo, Yiyo %D 2011 %J Appl. Soft Comput. %K dblp %N 8 %P 5165-5180 %T Developing a Tω (the weakest t-norm) fuzzy GERT for evaluating uncertain process reliability in semiconductor manufacturing. %U http://dblp.uni-trier.de/db/journals/asc/asc11.html#LinWHK11 %V 11

@article{journals/asc/LinWHK11, added-at = {2018-11-30T00:00:00.000+0100}, author = {Lin, Kuo-Ping and Wu, Ming-Jia and Hung, Kuo-Chen and Kuo, Yiyo}, biburl = {https://www.bibsonomy.org/bibtex/294365d7fb55570ea8c2fabd16a950d18/dblp}, ee = {https://doi.org/10.1016/j.asoc.2011.05.043}, interhash = {ebff7366ab70ebb1322528526bd901fa}, intrahash = {94365d7fb55570ea8c2fabd16a950d18}, journal = {Appl. Soft Comput.}, keywords = {dblp}, number = 8, pages = {5165-5180}, timestamp = {2018-12-01T12:53:12.000+0100}, title = {Developing a Tω (the weakest t-norm) fuzzy GERT for evaluating uncertain process reliability in semiconductor manufacturing.}, url = {http://dblp.uni-trier.de/db/journals/asc/asc11.html#LinWHK11}, volume = 11, year = 2011 }