%0 Journal Article %1 journals/jssc/KirihataWWDYKFW96 %A Kirihata, Toshiaki %A Watanabe, Yohji %A Wong, Hing %A DeBrosse, John K. %A Yoshida, Munehiro %A Kato, Daisuke %A Fujii, Shuso %A Wordeman, Matthew R. %A Poechmueller, Peter %A Parke, Stephen A. %A Asao, Yoshiaki %D 1996 %J IEEE J. Solid State Circuits %K dblp %N 4 %P 558-566 %T Fault-tolerant designs for 256 Mb DRAM. %U http://dblp.uni-trier.de/db/journals/jssc/jssc31.html#KirihataWWDYKFW96 %V 31

@article{journals/jssc/KirihataWWDYKFW96, added-at = {2022-10-02T00:00:00.000+0200}, author = {Kirihata, Toshiaki and Watanabe, Yohji and Wong, Hing and DeBrosse, John K. and Yoshida, Munehiro and Kato, Daisuke and Fujii, Shuso and Wordeman, Matthew R. and Poechmueller, Peter and Parke, Stephen A. and Asao, Yoshiaki}, biburl = {https://www.bibsonomy.org/bibtex/2b26c23930d2db57b4ae2f6844494575b/dblp}, ee = {https://doi.org/10.1109/4.499733}, interhash = {f01df3c8b8482de5ff296f7edf4d45cf}, intrahash = {b26c23930d2db57b4ae2f6844494575b}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 4, pages = {558-566}, timestamp = {2024-04-08T10:42:58.000+0200}, title = {Fault-tolerant designs for 256 Mb DRAM.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc31.html#KirihataWWDYKFW96}, volume = 31, year = 1996 }