%0 Journal Article %1 journals/mr/UbarKJRJ18 %A Ubar, Raimund %A Kostin, Sergei %A Jenihhin, Maksim %A Raik, Jaan %A Jürimägi, Lembit %D 2018 %J Microelectron. Reliab. %K dblp %P 252-261 %T Fast identification of true critical paths in sequential circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr81.html#UbarKJRJ18 %V 81

@article{journals/mr/UbarKJRJ18, added-at = {2020-10-26T00:00:00.000+0100}, author = {Ubar, Raimund and Kostin, Sergei and Jenihhin, Maksim and Raik, Jaan and Jürimägi, Lembit}, biburl = {https://www.bibsonomy.org/bibtex/25c2b71f83d4934f63692e15672c544ab/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.11.027}, interhash = {f0b9c611ea2e1a1d720972b33649210d}, intrahash = {5c2b71f83d4934f63692e15672c544ab}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {252-261}, timestamp = {2020-10-27T12:44:45.000+0100}, title = {Fast identification of true critical paths in sequential circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr81.html#UbarKJRJ18}, volume = 81, year = 2018 }