%0 Conference Paper %1 conf/ats/SuCHTLL04 %A Su, C. C. %A Chang, C. S. %A Huang, H. W. %A Tu, D. S. %A Lee, C. L. %A Lin, Jerry C. H. %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 308-312 %T Dynamic Analog Testing via ATE Digital Test Channels. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#SuCHTLL04 %@ 0-7695-2235-1

@inproceedings{conf/ats/SuCHTLL04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Su, C. C. and Chang, C. S. and Huang, H. W. and Tu, D. S. and Lee, C. L. and Lin, Jerry C. H.}, biburl = {https://www.bibsonomy.org/bibtex/26634205e530306be567b4181916303cf/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.37}, interhash = {f165ebf4e6a11d351e4605617dcf63e1}, intrahash = {6634205e530306be567b4181916303cf}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {308-312}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {Dynamic Analog Testing via ATE Digital Test Channels.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#SuCHTLL04}, year = 2004 }