%0 Conference Paper %1 conf/iccad/KuppHCM12 %A Kupp, Nathan %A Huang, Ke %A Jr., John M. Carulli %A Makris, Yiorgos %B ICCAD %D 2012 %E Hu, Alan J. %I ACM %K dblp %P 23-29 %T Spatial correlation modeling for probe test cost reduction in RF devices. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2012.html#KuppHCM12 %@ 978-1-4577-1398-9

@inproceedings{conf/iccad/KuppHCM12, added-at = {2022-04-27T00:00:00.000+0200}, author = {Kupp, Nathan and Huang, Ke and Jr., John M. Carulli and Makris, Yiorgos}, biburl = {https://www.bibsonomy.org/bibtex/2736c47a489598df683add5f7f3a77514/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2012}, editor = {Hu, Alan J.}, ee = {https://ieeexplore.ieee.org/document/6386584/}, interhash = {f17ef6f5a461f6872ef3c67a1f54bd05}, intrahash = {736c47a489598df683add5f7f3a77514}, isbn = {978-1-4577-1398-9}, keywords = {dblp}, pages = {23-29}, publisher = {ACM}, timestamp = {2024-04-10T17:55:19.000+0200}, title = {Spatial correlation modeling for probe test cost reduction in RF devices.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2012.html#KuppHCM12}, year = 2012 }