%0 Journal Article %1 journals/mr/LorinVGGBGG18 %A Lorin, Thomas %A Vandendaele, William %A Gwoziecki, Romain %A Gillot, Charlotte %A Biscarrat, Jérome %A Ghibaudo, Gérard %A Gaillard, Fred %D 2018 %J Microelectron. Reliab. %K dblp %P 641-644 %T Study of forward AC stress degradation of GaN-on-Si Schottky diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#LorinVGGBGG18 %V 88-90

@article{journals/mr/LorinVGGBGG18, added-at = {2022-01-03T00:00:00.000+0100}, author = {Lorin, Thomas and Vandendaele, William and Gwoziecki, Romain and Gillot, Charlotte and Biscarrat, Jérome and Ghibaudo, Gérard and Gaillard, Fred}, biburl = {https://www.bibsonomy.org/bibtex/2ed075f3d3e1006652f3fdc03f806ba89/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.07.103}, interhash = {f44850762baf32b276f9045c7df9e84e}, intrahash = {ed075f3d3e1006652f3fdc03f806ba89}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {641-644}, timestamp = {2024-04-09T02:48:59.000+0200}, title = {Study of forward AC stress degradation of GaN-on-Si Schottky diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#LorinVGGBGG18}, volume = {88-90}, year = 2018 }