%0 Conference Paper %1 conf/ats/EmoriKIAAN97 %A Emori, Michiaki %A Kumagai, Junko %A Itaya, Koichi %A Aikyo, Takashi %A Anan, Tomoko %A Niimi, Junichi %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 126- %T ATREX : Design for Testability System for Mega Gate LSIs. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#EmoriKIAAN97 %@ 0-8186-8209-4

@inproceedings{conf/ats/EmoriKIAAN97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Emori, Michiaki and Kumagai, Junko and Itaya, Koichi and Aikyo, Takashi and Anan, Tomoko and Niimi, Junichi}, biburl = {https://www.bibsonomy.org/bibtex/23b3c97d15ada9610655bfbabb9ea4b30/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643947}, interhash = {f4eedfa25a08ddb491a878b9a225fe06}, intrahash = {3b3c97d15ada9610655bfbabb9ea4b30}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {126-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {ATREX : Design for Testability System for Mega Gate LSIs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#EmoriKIAAN97}, year = 1997 }