%0 Conference Paper %1 conf/icicdt/MitaniFHM12 %A Mitani, Yuichiro %A Fukatsu, Shigeto %A Hagishima, Daisuke %A Matsuzawa, Kazuya %B ICICDT %D 2012 %I IEEE %K dblp %P 1-4 %T Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component. %U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#MitaniFHM12 %@ 978-1-4673-0146-6

@inproceedings{conf/icicdt/MitaniFHM12, added-at = {2021-04-09T00:00:00.000+0200}, author = {Mitani, Yuichiro and Fukatsu, Shigeto and Hagishima, Daisuke and Matsuzawa, Kazuya}, biburl = {https://www.bibsonomy.org/bibtex/2db76e1ee8bd337ab988a1863c4256cfa/dblp}, booktitle = {ICICDT}, crossref = {conf/icicdt/2012}, ee = {https://doi.org/10.1109/ICICDT.2012.6232842}, interhash = {f807b7b0481f43f86288551ab3b12312}, intrahash = {db76e1ee8bd337ab988a1863c4256cfa}, isbn = {978-1-4673-0146-6}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T21:05:54.000+0200}, title = {Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component.}, url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2012.html#MitaniFHM12}, year = 2012 }