%0 Conference Paper %1 conf/vts/JiangWWW11 %A Jiang, Zhongwei %A Wang, Zheng %A Wang, Jing %A Walker, D. M. H. %B VTS %D 2011 %I IEEE Computer Society %K dblp %P 52-57 %T Levelized low cost delay test compaction considering IR-drop induced power supply noise. %U http://dblp.uni-trier.de/db/conf/vts/vts2011.html#JiangWWW11 %@ 978-1-61284-657-6

@inproceedings{conf/vts/JiangWWW11, added-at = {2011-06-04T00:00:00.000+0200}, author = {Jiang, Zhongwei and Wang, Zheng and Wang, Jing and Walker, D. M. H.}, biburl = {https://www.bibsonomy.org/bibtex/2ff2840c81033310089007c0a9229bc66/dblp}, booktitle = {VTS}, crossref = {conf/vts/2011}, ee = {http://dx.doi.org/10.1109/VTS.2011.5783754}, interhash = {f84d5ce43d7180163d5210f6f9b106ef}, intrahash = {ff2840c81033310089007c0a9229bc66}, isbn = {978-1-61284-657-6}, keywords = {dblp}, pages = {52-57}, publisher = {IEEE Computer Society}, timestamp = {2015-06-18T22:51:32.000+0200}, title = {Levelized low cost delay test compaction considering IR-drop induced power supply noise.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2011.html#JiangWWW11}, year = 2011 }