%0 Conference Paper %1 conf/ats/KuangXY08 %A Kuang, Jishun %A Xiong, Ouyang %A You, Zhiqiang %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 75-80 %T A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#KuangXY08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/KuangXY08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kuang, Jishun and Xiong, Ouyang and You, Zhiqiang}, biburl = {https://www.bibsonomy.org/bibtex/21839c20ff3a2ada7efef94c79926b2ee/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.25}, interhash = {f88fb87d8b8495bdcefd411bbc90d5cd}, intrahash = {1839c20ff3a2ada7efef94c79926b2ee}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {75-80}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#KuangXY08}, year = 2008 }