%0 Conference Paper %1 conf/itc/Nigh12 %A Nigh, Phil %B ITC %D 2012 %I IEEE Computer Society %K dblp %P 1-4 %T How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? %U http://dblp.uni-trier.de/db/conf/itc/itc2012.html#Nigh12 %@ 978-1-4673-1594-4

@inproceedings{conf/itc/Nigh12, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nigh, Phil}, biburl = {https://www.bibsonomy.org/bibtex/2afd0a767590411c33ab842de69ba352b/dblp}, booktitle = {ITC}, crossref = {conf/itc/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401528}, interhash = {fbfe64949fa87a649d3038316f8a23c6}, intrahash = {afd0a767590411c33ab842de69ba352b}, isbn = {978-1-4673-1594-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:30:06.000+0200}, title = {How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2012.html#Nigh12}, year = 2012 }