%0 Journal Article %1 journals/tvlsi/HwangR10 %A Hwang, Myeong-Eun %A Roy, Kaushik %D 2010 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 2 %P 281-290 %T ABRM: Adaptive Beta -Ratio Modulation for Process-Tolerant Ultradynamic Voltage Scaling. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#HwangR10 %V 18

@article{journals/tvlsi/HwangR10, added-at = {2020-03-11T00:00:00.000+0100}, author = {Hwang, Myeong-Eun and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2dcdc088ab66445d32b68eb470ef846b6/dblp}, ee = {https://doi.org/10.1109/TVLSI.2008.2010767}, interhash = {fc518226710f6200ed95e5f44c25d618}, intrahash = {dcdc088ab66445d32b68eb470ef846b6}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 2, pages = {281-290}, timestamp = {2020-03-12T11:42:43.000+0100}, title = {ABRM: Adaptive Beta -Ratio Modulation for Process-Tolerant Ultradynamic Voltage Scaling.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#HwangR10}, volume = 18, year = 2010 }