%0 Journal Article %1 journals/tcas/CaiWNLSYZ19 %A Cai, Hao %A Wang, You %A de Barros Naviner, Lirida Alves %A Liu, Xinning %A Shan, Weiwei %A Yang, Jun %A Zhao, Weisheng %D 2019 %J IEEE Trans. Circuits Syst. I Regul. Pap. %K dblp %N 1 %P 239-250 %T Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration. %U http://dblp.uni-trier.de/db/journals/tcas/tcasI66.html#CaiWNLSYZ19 %V 66-I

@article{journals/tcas/CaiWNLSYZ19, added-at = {2022-10-02T00:00:00.000+0200}, author = {Cai, Hao and Wang, You and de Barros Naviner, Lirida Alves and Liu, Xinning and Shan, Weiwei and Yang, Jun and Zhao, Weisheng}, biburl = {https://www.bibsonomy.org/bibtex/278f4282ceef2a4c50b8cfc16ca06a401/dblp}, ee = {https://doi.org/10.1109/TCSI.2018.2854277}, interhash = {fc5b139eae6a69a718c12989704da4d0}, intrahash = {78f4282ceef2a4c50b8cfc16ca06a401}, journal = {IEEE Trans. Circuits Syst. I Regul. Pap.}, keywords = {dblp}, number = 1, pages = {239-250}, timestamp = {2024-04-09T06:14:07.000+0200}, title = {Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI66.html#CaiWNLSYZ19}, volume = {66-I}, year = 2019 }