%0 Journal Article %1 journals/mr/MahdaviM09a %A Mahdavi, Seyyed Javad Seyyed %A Mohammadi, Karim %D 2009 %J Microelectron. Reliab. %K dblp %N 8 %P 924-933 %T SCRAP: Sequential circuits reliability analysis program. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#MahdaviM09a %V 49

@article{journals/mr/MahdaviM09a, added-at = {2020-02-22T00:00:00.000+0100}, author = {Mahdavi, Seyyed Javad Seyyed and Mohammadi, Karim}, biburl = {https://www.bibsonomy.org/bibtex/230dcfff9c2f589e12b54811ab72a6211/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.06.001}, interhash = {fe672e16e91ef9c037e74a70a49d1fbc}, intrahash = {30dcfff9c2f589e12b54811ab72a6211}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {924-933}, timestamp = {2020-02-25T13:23:40.000+0100}, title = {SCRAP: Sequential circuits reliability analysis program.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#MahdaviM09a}, volume = 49, year = 2009 }