%0 Conference Paper %1 conf/itc/FritzemeierSTH90 %A Fritzemeier, Ronald R. %A Soden, Jerry M. %A Treece, R. Keith %A Hawkins, Charles F. %B ITC %D 1990 %I IEEE Computer Society %K dblp %P 427-435 %T Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. %U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#FritzemeierSTH90 %@ 0-8186-9064-X

@inproceedings{conf/itc/FritzemeierSTH90, added-at = {2023-03-23T00:00:00.000+0100}, author = {Fritzemeier, Ronald R. and Soden, Jerry M. and Treece, R. Keith and Hawkins, Charles F.}, biburl = {https://www.bibsonomy.org/bibtex/234b0786ac25e843705ebf00ed2336dd2/dblp}, booktitle = {ITC}, crossref = {conf/itc/1990}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114051}, interhash = {ff574e5cb6452117d51f3fa69014ac6c}, intrahash = {34b0786ac25e843705ebf00ed2336dd2}, isbn = {0-8186-9064-X}, keywords = {dblp}, pages = {427-435}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:40.000+0200}, title = {Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#FritzemeierSTH90}, year = 1990 }