%0 Conference Paper %1 conf/itc/SatoKIYH01 %A Sato, Yasuo %A Kohno, Masaki %A Ikeda, Toshio %A Yamazaki, Iwao %A Hamamoto, Masato %B ITC %D 2001 %I IEEE Computer Society %K dblp %P 1059-1067 %T An evaluation of defect-oriented test: WELL-controlled low voltage test. %U http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SatoKIYH01 %@ 0-7803-7169-0

@inproceedings{conf/itc/SatoKIYH01, added-at = {2023-03-23T00:00:00.000+0100}, author = {Sato, Yasuo and Kohno, Masaki and Ikeda, Toshio and Yamazaki, Iwao and Hamamoto, Masato}, biburl = {https://www.bibsonomy.org/bibtex/2e7134bc29f82d0c6c62ddceedf05cd0c/dblp}, booktitle = {ITC}, crossref = {conf/itc/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2001.966732}, interhash = {20b6a4f5c9174de4328e60cb0eeeb36b}, intrahash = {e7134bc29f82d0c6c62ddceedf05cd0c}, isbn = {0-7803-7169-0}, keywords = {dblp}, pages = {1059-1067}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:56.000+0200}, title = {An evaluation of defect-oriented test: WELL-controlled low voltage test.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2001.html#SatoKIYH01}, year = 2001 }