%0 Conference Paper %1 conf/ats/MoghaddamRRJ11 %A Moghaddam, Elham K. %A Rajski, Janusz %A Reddy, Sudhakar M. %A Janicki, Jakub %B Asian Test Symposium %D 2011 %I IEEE Computer Society %K dblp %P 267-272 %T Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. %U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#MoghaddamRRJ11 %@ 978-1-4577-1984-4

@inproceedings{conf/ats/MoghaddamRRJ11, added-at = {2023-03-24T00:00:00.000+0100}, author = {Moghaddam, Elham K. and Rajski, Janusz and Reddy, Sudhakar M. and Janicki, Jakub}, biburl = {https://www.bibsonomy.org/bibtex/2116bcaec5277f519f425c048acef0f43/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2011}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2011.46}, interhash = {6c75cc2910b3142c7ec6e5d9cdb6c060}, intrahash = {116bcaec5277f519f425c048acef0f43}, isbn = {978-1-4577-1984-4}, keywords = {dblp}, pages = {267-272}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:27.000+0200}, title = {Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#MoghaddamRRJ11}, year = 2011 }