%0 Conference Paper %1 conf/ats/NikaidoFSNS13 %A Nikaido, Masafumi %A Funatsu, Yukihisa %A Seiyama, Tetsuya %A Nonaka, Junpei %A Shigeta, Kazuki %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 67-72 %T Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#NikaidoFSNS13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/NikaidoFSNS13, added-at = {2023-03-24T00:00:00.000+0100}, author = {Nikaido, Masafumi and Funatsu, Yukihisa and Seiyama, Tetsuya and Nonaka, Junpei and Shigeta, Kazuki}, biburl = {https://www.bibsonomy.org/bibtex/2171b637f9aa2ed34b319b9d4a2009ebb/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.21}, interhash = {5492a5e4fece9a09967e4c13f1e2c92c}, intrahash = {171b637f9aa2ed34b319b9d4a2009ebb}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {67-72}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {Failure Localization of Logic Circuits Using Voltage Contrast Considering State of Transistors.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#NikaidoFSNS13}, year = 2013 }