%0 Conference Paper %1 conf/vts/ChenMBR05 %A Chen, Qikai %A Mahmoodi-Meimand, Hamid %A Bhunia, Swarup %A Roy, Kaushik %B VTS %D 2005 %I IEEE Computer Society %K dblp %P 292-297 %T Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. %U http://dblp.uni-trier.de/db/conf/vts/vts2005.html#ChenMBR05 %@ 0-7695-2314-5

@inproceedings{conf/vts/ChenMBR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Chen, Qikai and Mahmoodi-Meimand, Hamid and Bhunia, Swarup and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2183e1930f12f7ad7422a601bc539cf9e/dblp}, booktitle = {VTS}, crossref = {conf/vts/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2005.58}, interhash = {a33b109e3649384b24df8575079ac2a4}, intrahash = {183e1930f12f7ad7422a601bc539cf9e}, isbn = {0-7695-2314-5}, keywords = {dblp}, pages = {292-297}, publisher = {IEEE Computer Society}, timestamp = {2024-05-13T09:57:35.000+0200}, title = {Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2005.html#ChenMBR05}, year = 2005 }