%0 Conference Paper %1 conf/irps/KasimLPPGIWWH23 %A Kasim, Rahim %A Lin, Cheyun %A Perini, Christopher %A Palmer, James %A Gilda, N. %A Imam, S. %A Weber, Justin R. %A Wallace, C. %A Hicks, Jeffery %B IRPS %D 2023 %I IEEE %K dblp %P 1-8 %T Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#KasimLPPGIWWH23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/KasimLPPGIWWH23, added-at = {2023-05-24T00:00:00.000+0200}, author = {Kasim, Rahim and Lin, Cheyun and Perini, Christopher and Palmer, James and Gilda, N. and Imam, S. and Weber, Justin R. and Wallace, C. and Hicks, Jeffery}, biburl = {https://www.bibsonomy.org/bibtex/2984938bb6e68be1455170b72d7c65024/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117619}, interhash = {21d5b9f28c85a1cbd1251252e220c731}, intrahash = {984938bb6e68be1455170b72d7c65024}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#KasimLPPGIWWH23}, year = 2023 }