%0 Conference Paper %1 verron2006fault %A Verron, Sylvain %A Tiplica, Teodor %A Kobi, Abdessamad %B Industrial Technology, 2006. ICIT 2006. IEEE International Conference on %D 2006 %K Fault SemDat TEP %P 98--103 %T Fault diagnosis with bayesian networks: Application to the tennessee eastman process

@inproceedings{verron2006fault, added-at = {2016-12-01T12:43:18.000+0100}, author = {Verron, Sylvain and Tiplica, Teodor and Kobi, Abdessamad}, biburl = {https://www.bibsonomy.org/bibtex/22b655a3daee0a9c2f6dc49fdbc77d4f1/lurbas}, booktitle = {Industrial Technology, 2006. ICIT 2006. IEEE International Conference on}, interhash = {2593234dd1cf9544b076a173900d84ff}, intrahash = {2b655a3daee0a9c2f6dc49fdbc77d4f1}, keywords = {Fault SemDat TEP}, organization = {IEEE}, pages = {98--103}, timestamp = {2016-12-01T12:44:45.000+0100}, title = {Fault diagnosis with bayesian networks: Application to the tennessee eastman process}, year = 2006 }