Abstract
Single ion-channel recording using the conventional patch-clamping technique has several limitations. One of the main challenges is to reduce the background noise associated with the patch-clamp setup. Planar patch-clamping has many advantages, one of which is the reduction of noise by using planar micropipettes built in silicon. In this work, we analyze the various sources of noise present in the patch-clamp system, showing the noise improvements by choosing planar micropipettes. Also, we show the design topology and the fabrication of an integrated planar patch-clamp system.