%0 Journal Article %1 giannuzzi1999review %A Giannuzzi, LA %A Stevie, FA %D 1999 %I Elsevier %J Micron %K imported %N 3 %P 197--204 %T A review of focused ion beam milling techniques for TEM specimen preparation %V 30

@article{giannuzzi1999review, added-at = {2019-02-26T21:36:34.000+0100}, author = {Giannuzzi, LA and Stevie, FA}, biburl = {https://www.bibsonomy.org/bibtex/23166b9688d64d7161ff7771ae8c7ac67/rspreeuw}, interhash = {a8610bb802b8d181a47cd2bd198d1fa3}, intrahash = {3166b9688d64d7161ff7771ae8c7ac67}, journal = {Micron}, keywords = {imported}, number = 3, pages = {197--204}, publisher = {Elsevier}, timestamp = {2019-02-26T21:36:34.000+0100}, title = {A review of focused ion beam milling techniques for TEM specimen preparation}, volume = 30, year = 1999 }