%0 Journal Article %1 journals/mr/YapTLDFZHTZLHWL15 %A Yap, Huei Hao %A Tan, Pik Kee %A Low, G. R. %A Dawood, M. K. %A Feng, Hua %A Zhao, Yuzhe %A He, Ran %A Tan, Hao %A Zhu, J. %A Liu, Binghai %A Huang, Y. M. %A Wang, D. D. %A Lam, Jeffrey %A Mai, Zhihong %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1611-1616 %T Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#YapTLDFZHTZLHWL15 %V 55

@article{journals/mr/YapTLDFZHTZLHWL15, added-at = {2024-06-10T00:00:00.000+0200}, author = {Yap, Huei Hao and Tan, Pik Kee and Low, G. R. and Dawood, M. K. and Feng, Hua and Zhao, Yuzhe and He, Ran and Tan, Hao and Zhu, J. and Liu, Binghai and Huang, Y. M. and Wang, D. D. and Lam, Jeffrey and Mai, Zhihong}, biburl = {https://www.bibsonomy.org/bibtex/24073c0f0072f61e61277109730c60b3f/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.037}, interhash = {f90296dd3187b5bda7955d4dc637a239}, intrahash = {4073c0f0072f61e61277109730c60b3f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1611-1616}, timestamp = {2024-06-17T07:17:27.000+0200}, title = {Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#YapTLDFZHTZLHWL15}, volume = 55, year = 2015 }